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T5581P/ T5571P
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| Memory Test System |
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New Solutions for Evaluation and Production Testing of Advanced Memory Devices
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Driven in part by the rapid growth in
multimedia applications, microprocessor speeds are increasing at spectacular
rates. It follows then that new memory devices are being designed with the
ability to accommodate larger capacities, higher speeds, higher performance, and
wider bits. And, that this in turn is impacting the requirements of the testing
environment as well. The T5581P/5571P guarantees a overall timing accuracy of
¡Ó400ps or less, realizing a testing speed of 250MHz/125MHz. |
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The system accommodates high-speed and small-amplitude interfacing and, through a BiCMOS test head with a
guaranteed minimum amplitude of 0.2Vpp and a minimum pulse width of 2ns, it guarantees high-speed and high-precision measurement of ultra high-speed memory devices.
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The high-speed redundancy analysis afforded by the MRA (option) contributes largely to a reduction in test time.
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T5581P/T5571P |
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Target Devices |
SDRAM,CDRAM,DRAM,EDO-DRAM,SSRAM,SRAM,etc. |
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Test Speed |
250 MHz (T5581P)/125 MHz (T5571P) |
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Overall Timing Accuracy |
¡Ó400 ps |
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Simultaneous Testing |
Up to 32 high-pincount I/O devices(X16,X18 bits) (using two heads) |
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