IC Test Systems SoC Test Systems LCD Driver Test Systems RFIC Test Systems E-Beam Test Systems Memory Test Systems Dynamic Test Handler Software Discontinued Product E-Beam Lithography
		T3326A/T3347A VLSI Test System Low-Cost Testing of High-End MCU These systems were designed for low-cost testing of 16- and 32-bit MCU used in such applications as quad-speed CD-ROM drives, kanji character printers, cellular telephones, and car navigation systems. BiCMOS and CMOS technology affords the high-speed, high-accuracy testing capability previously implemented with ECL devices. Hardware is optimized to reduce testing cost, system size, and power consumption. 20 MHz (T3326A) and 40 MHz (T3347A) testing speed. Accommodates up to 256 I/O pins. Simultaneous testing of up to four devices or eight devices, with one or two stations, respectively.
		. T3326A/T3347A Target Devices 4/8/16/32 bit, MCU,MPU, ASIC Test Speed 20/40 MHz(multiplex mode),40/80 MHz (multiplex mode, data rate) Pin Configurations 256 I/O pins Overall Timing Accuracy ±2.0ns/±1.4 ns (HV2 head) Simultaneous Testing Up to 8 VLSIs per 2 test head

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