愛德萬測試總裁暨執行長松野晴夫(Haruo Matsuno)先生獲「電子成就獎」 (2013/5/9) 　

愛德萬測試獲德州儀器 2012 卓越供應商獎(2013/4/11) 　

愛德萬測試為台灣封測大廠力成科技安裝多套 V93000 Dragon Testers (2013/4/11) 　

愛德萬測試為飛思卡爾(Freescale)亞利桑那州和亞洲數個據點導入測試機(2013/3/26) 　

愛德萬測試 VOICE 2013 使用者社群暨合作夥伴研討會邀請未來學專家,Glen Hiemstra 發表主題演講(2013/2/24) 　

愛德萬全新測試機台獲 Marvell 半導體公司採用 ,為成本動見觀瞻的高產能 IC 測試降低成本(2012/12/24) 　

新廠落成專訪廣告(2012/12/14) 　

愛德萬推出全新晶圓用 MVM-SEM 系統 E3310(2012/11/14) 　

愛德萬測試開發出光罩缺陷檢驗掃描式電子顯微鏡系統 E5610(2012/11/14) 　

愛德萬測試開發出 1Xnm 節點電子束微影系統(2012/11/14) 　

全新 T2000 整合性大量並列同測解決方案，為微控制器與智慧卡晶片創造最低測試成本 (2012/11/12) 　

愛德萬 TAS7500 系列再推兩款光譜造影系統及一套全新穿透率極化分析模組 (2012/10/10) 　

Advantest Establishes New Subsidiary(2012/10/1) 　

Advantest’s Terahertz Spectroscopic/Imaging System TAS7500 Adopted by Astellas Pharma Inc.(2012/9/4) 　

Advantest Ships 500th V93000 Port Scale RF Tester to Chinese Producer of Wireless Communication ICs(2012/7/27) 　

Advantest Wins Best Supplier Award from STATS ChipPAC(2012/7/26) 　

Advantest Introduces Industry’s Highest Capability 3-in-1 Semiconductor Test Clock Module to Improve Yields and Save Time & Money in Testing High-Speed ICs(2012/7/5) 　

Advantest Corporation Receives Intel's Prefered Quality Supplier Award(2012/4/3) 　

Advantest Completes Integration of Verigy’s Global Operations into its Corporate Structure(2012/4/2) 　

T5773 Best in Test Award(2012/2/7) 　

New Year Address(2012/1/5) 　

Global Leader in Computing Technology Accepts its 1000th T2000(2011/12/6) 　

Advantest to Exhibit at SEMICON Japan 2011(2011/11/29) 　

Toyota Motor Corporation Adopts T2000(2011/11/21) 　

Advantest Announces NAND Flash Test Solution(2011/7/11) 　

Advantest Completes Acquisition of Verigy Shares (2011/7/4) 　

Advantest and Verigy announce Verigy Shareholder Approval of Proposed Acquisition by Advantest (2011/6/20)(2011/6/20)